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DA-Test Endorses DFT Microsystems Technology
OTTAWA, 10 Novembre 2005 -
/CNW Telbec/ - DFT Microsystems Canada today announced that DA-Test has successfully completed evaluations of the DJ60 Controlled Jitter Source and concluded that the DJ60 represents a significant step forward in the testing of IC serial data interfaces such as PCI Express and Serial Rapid IO. The conclusions are a result of extensive technical analysis and comparative benchmarking performed at DA-Test.
"For the purposes of design validation and characterization of high-speed serial interfaces, the DJ60 provides compelling advantages over alternative approaches," said Scott Bulbrook, VP Engineering at DA-Test. "The DJ60 technology is also potentially very interesting as an enhancement to ATEsystems in semiconductor production testing. With planned feature evolution and related evaluations, the DJ60 will represent a significant addition to available production test approaches.
"According to David Lisk, President and CEO of DFT Microsystems, "DA-Test's extensive experience in high-speed I/O testing brings significant credibility to the impressive results of the DJ60 technical evaluation. As the industry's first multi channel compact jitter insertion module, the DJ60 willprovide a much-needed cost-effective solution for determining receive characteristics."
About DA-Test Incorporated
Established in 2002, DA-Test is the first and only independent semiconductor test house in Canada. Using leading-edge ATE equipment and tools, DA-Test provides a complete range of IC test development and strategic operations services to semiconductor design companies. With over a century of semiconductor industry management experience, DA-Test's deep engineering expertise in RF, mixed signal, and high-speed digital test addresses telecom, enterprise, consumer and professional electronics, datacom, and military application markets. DA-Test serves a global customer base across the full breadth of semiconductor business models, from fabless semiconductor companies to integrated device manufacturers. For more information visit www.da-test.com.
About DFT Microsystems, Inc.
DFT Microsystems delivers a breakthrough in semiconductor test cost and performance via miniature, on-board, high throughput, mixed-signal and high- speed digital test modules. By delivering state of the art performance and signal processing capabilities within its test modules, DFT Microsystems' technology extends the capabilities and economic life of any ATE platform. Our modules provide solutions that dramatically reduce test cost and accelerate time-to-volume. For more information visit www.dftmicrosystems.ca .
Media Contacts:
David Lisk, President & CEO, DFT Microsystems Canada, Inc.
(514) 878-8271,
david.lisk@dftmicrosystems.ca
Kira Reid, VP Business Development, DA-Test Incorporated
(613) 592-2233
kirareid@da-test.com
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